1. Self-Aware Reliable and Reconfigurable Computing Systems - An Overview;2024 IEEE International Parallel and Distributed Processing Symposium Workshops (IPDPSW);2024-05-27
2. Failure Probability due to Radiation-Induced Effects in FinFET SRAM Cells under Process Variations;Journal of Electronic Testing;2024-02
3. A 0.8V, Tri-State Inverter based SRAM Cell for SoC Applications;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06
4. SMART: Selective MAC zero-optimization for neural network reliability under radiation;Microelectronics Reliability;2023-11
5. A Machine Learning-driven EDAC Method for Space-Application Memory;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03