Spectral X-ray Detectors Based on Multi-Element Chromium Compensated Gallium Arsenide Sensors and Application Specific Integrated Circuits: : Keynote Paper Devoted 75th Anniversary of the Transistor-Reference-Cited by-同舟云学术

Spectral X-ray Detectors Based on Multi-Element Chromium Compensated Gallium Arsenide Sensors and Application Specific Integrated Circuits: : Keynote Paper Devoted 75th Anniversary of the Transistor

Published:2022-11-17 Issue: Volume: Page:
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Container-title:2022 International Siberian Conference on Control and Communications (SIBCON)
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Author:

Shaimerdenova Leila¹,Vinnik Aleksander¹,Skakunov Maksim¹,Tolbanov Oleg¹,Tyazhev Anton¹,Zarubin Andrey¹

Affiliation:

1. Tomsk State University,R&D Center «Advanced microelectronic technologies»,Tomsk,Russia

Funder

Tomsk State University

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10002870/10002871/10003000.pdf?arnumber=10003000

Reference16 articles.

1. Characterization of Chromium Compensated GaAs Sensors with the Charge-Integrating JUNGFRAU Readout Chip by Means of a Highly Collimated Pencil Beam

2. Multi-energy X-ray Techniques for NDT: a New Challenge;rebuffel;11th European Conference on Non-Destructive Testing (ECNDT 2014),2014

3. X-ray microbeam characterisation of crystalline defects in small pixel GaAs:Cr detectors

4. Characterisation of the HEXITEC4S X-ray spectroscopic imaging detector incorporating through-silicon via (TSV) technology

5. Detectors for the future of X-ray imaging

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