A Simple Test Structure for Directly Extracting Substrate Network Components in Deep n-Well RF-CMOS Modeling-Reference-Cited by-同舟云学术

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A Simple Test Structure for Directly Extracting Substrate Network Components in Deep n-Well RF-CMOS Modeling

Published:2009-11 Issue:11 Volume:30 Page:1200-1202
ISSN:0741-3106
Container-title:IEEE Electron Device Letters
language:
Short-container-title:IEEE Electron Device Lett.

Author:

Jun Liu ,Lingling Sun ,Liheng Lou ,Huang Wang ,McCorkell C.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/55/5291954/05280288.pdf?arnumber=5280288

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Novel Extraction Method for Source and Drain Series Resistances in Silicon Nanowire Metal–Oxide–Semiconductor Field-Effect-Transistors Based on Radio-Frequency Analysis;Japanese Journal of Applied Physics;2013-04-01

2. Extraction of T-Type Substrate Resistance Components for Radio-Frequency Metal–Oxide–Semiconductor Field-Effect Transistors Based on Two-PortS-Parameter Measurement;Japanese Journal of Applied Physics;2012-11-01

3. Extraction of T-Type Substrate Resistance Components for Radio-Frequency Metal–Oxide–Semiconductor Field-Effect Transistors Based on Two-Port $S$-Parameter Measurement;Japanese Journal of Applied Physics;2012-10-30

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