Author:
Krenz-Baath Rene,Zadegan Farrokh Ghani,Larsson Erik
Cited by
14 articles.
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1. A Multi-Objective Evolutionary Approach for Test Network Design;2024 IEEE European Test Symposium (ETS);2024-05-20
2. Embedded Tutorial: Access to On-chip Instruments via Functional Ports;2024 IEEE 25th Latin American Test Symposium (LATS);2024-04-09
3. RC-IJTAG: A Methodology for Designing Remotely-Controlled IEEE 1687 Scan Networks;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03
4. Synthesis of IJTAG Networks for Multi-Power Domain Systems on Chips;2023 IEEE European Test Symposium (ETS);2023-05-22
5. Optimal Pattern Retargeting in IEEE 1687 Networks: A SAT-based Upper-Bound Computation;ACM Transactions on Design Automation of Electronic Systems;2023-05-17