Author:
Sunter Stephen,Tilmann Matthias
Cited by
3 articles.
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1. Testing of FPGA Input/Output Pins Using BIST;Information and Communication Technology for Competitive Strategies (ICTCS 2020);2021
2. Built-In Self-Test;Testing of Interposer-Based 2.5D Integrated Circuits;2017
3. Built-In Self-Test and Test Scheduling for Interposer-Based 2.5D IC;ACM Transactions on Design Automation of Electronic Systems;2015-09-28