Author:
Wohl P.,Waicukauski J.A.,Maston G.A.,Colburn J.E.
Cited by
16 articles.
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1. X-Tolerant Logic BIST for Automotive Designs using Observation Scan Technology;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06
2. Novel Technique for Manufacturing, System-Level, and In-System Testing of Large SoC Using Functional Protocol-Based High-Speed I/O;IEEE Design & Test;2023-08
3. Design and Performance Comparison of X-Masking Models in DFT Applications;2023 8th International Conference on Communication and Electronics Systems (ICCES);2023-06-01
4. A Novel LBIST Signature Computation Method for Automotive Microcontrollers using a Digital Twin;2023 IEEE 41st VLSI Test Symposium (VTS);2023-04-24
5. Weighted test pattern generator (TPG) for built-in self-test (BIST);LOW RADIOACTIVITY TECHNIQUES 2022 (LRT 2022): Proceedings of the 8th International Workshop on Low Radioactivity Techniques;2023