Modeling, verification and pattern generation for reconfigurable scan networks

Author:

Baranowski Rafal,Kochte Michael A.,Wunderlich Hans-Joachim

Publisher

IEEE

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. RC-IJTAG: A Methodology for Designing Remotely-Controlled IEEE 1687 Scan Networks;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03

2. Optimal Pattern Retargeting in IEEE 1687 Networks: A SAT-based Upper-Bound Computation;ACM Transactions on Design Automation of Electronic Systems;2023-05-17

3. Improving IJTAG Test Efficiency and Security;2022 International Symposium on VLSI Design, Automation and Test (VLSI-DAT);2022-04-18

4. Integrated Circuit Digital Fingerprinting–Based Authentication;Authentication of Embedded Devices;2021

5. Reconfigurable Scan Networks;ACM Transactions on Design Automation of Electronic Systems;2015-03-02

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