Author:
Hapke F.,Reese M.,Rivers J.,Over A.,Ravikumar V.,Redemund W.,Glowatz A.,Schloeffel J.,Rajski J.
Cited by
9 articles.
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3. Defect Diagnosis Techniques for Silicon Customer Returns;Frontiers of Quality Electronic Design (QED);2023
4. Machine Learning Support for Cell-Aware Diagnosis;Machine Learning Support for Fault Diagnosis of System-on-Chip;2023
5. Understanding Vmin Failures for Improved Testing of Timing Marginalities;2022 IEEE International Test Conference (ITC);2022-09