Algorithm for dramatically improved efficiency in ADC linearity test
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/6387511/6401510/06401561.pdf?arnumber=6401561
Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A BIST Approach to Approximate Co-Testing of Embedded Data Converters;IEEE Design & Test;2024-06
2. Low-Cost Linearity Testing of High-Resolution ADCs Using Segmentation Modeling and Partial Polynomial Fitting;2024 IEEE International Symposium on Circuits and Systems (ISCAS);2024-05-19
3. Methods to Improve Linearity of Signal’s Analog-to-Digital Conversion with Self-Calibration;Machine Learning-based Design and Optimization of High-Speed Circuits;2023-12-31
4. On-chip Self-test Solutions for ADC survey and analysis;2023 IEEE 8th International Conference on Recent Advances and Innovations in Engineering (ICRAIE);2023-12-02
5. New Algorithm for Fast and Accurate Linearity Testing of High-Resolution SAR ADCs;2023 IEEE International Test Conference (ITC);2023-10-07
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