Author:
Mano T.,Takeya K.,Watanabe T.,Kiuchi K.,Ogawa T.,Hirata K.
Cited by
4 articles.
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1. Influences of circuit design on the characteristics of soft error in MOS dynamic RAMs;Electronics and Communications in Japan (Part I: Communications);1983
2. Access time analysis of dynamic MOS RAM;Electronics and Communications in Japan (Part I: Communications);1983
3. Two-dimensional analysis of hot-electron emission current in MOS FET;Electronics and Communications in Japan (Part I: Communications);1982
4. Manufacturing Process Technology for MOS VLSI;VLSI Electronics Microstructure Science;1981