Author:
Inamoto Tsutomu,Ohtomo Kazuki,Higami Yoshinobu
Cited by
2 articles.
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1. A Review of Intelligent Design for Test Based on Machine Learning;2023 International Symposium of Electronics Design Automation (ISEDA);2023-05-08
2. Preliminary Study on Noise-Resilient Artificial Neural Networks for On-Chip Test Generation;2022 IEEE 11th Global Conference on Consumer Electronics (GCCE);2022-10-18