Preliminary Study on Noise-Resilient Artificial Neural Networks for On-Chip Test Generation
Author:
Affiliation:
1. Ehime University 3 Bunkyo, Matsuyama,Graduate School of Science and Engineering,Ehime,Japan,791-8577
2. INFOCOM WEST JAPAN CORPORATION 1-6-29 Kyutaro-machi, Chuo-ku,Osaka,Japan,541-0056
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10013950/10014027/10014218.pdf?arnumber=10014218
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3. Generative adversarial nets;goodfellow;Advances in neural information processing systems,2014
4. Multiply accumulate operations in memristor crossbar arrays for analog computing
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