On the Resiliency of NCFET Circuits Against Voltage Over-Scaling-Reference-Cited by-同舟云学术

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On the Resiliency of NCFET Circuits Against Voltage Over-Scaling

Published:2021-04 Issue:4 Volume:68 Page:1481-1492
ISSN:1549-8328
Container-title:IEEE Transactions on Circuits and Systems I: Regular Papers
language:
Short-container-title:IEEE Trans. Circuits Syst. I

Author:

Paim Guilherme,Zervakis Georgios,Pahwa Girish,Chauhan Yogesh Singh,da Costa Eduardo Antonio Cesar,Bampi Sergio,Henkel Jorg,Amrouch Hussam

Funder

German Research Foundation (DFG) within the ACCROSS Project

CNPq

DAAD-CAPES Foundation PROBRAL Project

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/8919/9371268/09367304.pdf?arnumber=9367304

Cited by 17 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. AxRSU-$$2^{m}$$: Higher-Order m-Bit Approximate Encoders for Radix-$$2^{m}$$ Squarer Units;Circuits, Systems, and Signal Processing;2024-02-26

2. Passive Voltage Amplification in FE-FE-DE Heterostructure;IEEE Access;2024

3. Performance and Energy Studies on NC-FinFET Cache-Based Systems With FN-McPAT;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-09

4. Architectural Exploration for Energy-Efficient LMS and NLMS Adaptive Filters VLSI Design;2023 21st IEEE Interregional NEWCAS Conference (NEWCAS);2023-06-26

5. Ferroelectric Ternary Content Addressable Memories for Energy-Efficient Associative Search;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-04

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