Affiliation:
1. Chair of Semiconductor Test and Reliability (STAR), University of Stuttgart, Stuttgart, Germany
Funder
German Research Foundation (DFG) through the “ACCROSS: Approximate Computing aCROss the System Stack”
Advantest as part of the Graduate School Intelligent Methods for Test and Reliability (GS-IMTR) at the University of Stuttgart
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture
Cited by
1 articles.
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1. CMOS-RRAM based In-Memory Hamming Distance Calculation Technique;2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM);2024-03-03