A Sub-Electron-Noise Multi-Channel Cryogenic Skipper-CCD Readout ASIC-Reference-Cited by-同舟云学术

A Sub-Electron-Noise Multi-Channel Cryogenic Skipper-CCD Readout ASIC

Published:2023-06 Issue:6 Volume:70 Page:2306-2316
ISSN:1549-8328
Container-title:IEEE Transactions on Circuits and Systems I: Regular Papers
language:
Short-container-title:IEEE Trans. Circuits Syst. I

Author:

Bessia Fabricio Alcalde¹^ORCID,England Troy²^ORCID,Sun Hongzhi¹,Stefanazzi Leandro¹,Braga Davide¹^ORCID,Haro Miguel Sofo³,Li Shaorui¹,Estrada Juan¹^ORCID,Fahim Farah¹^ORCID

Affiliation:

1. Instituto Balseiro and Instituto de Nanociencia y Nanotecnología INN (CNEA-CONICET), San Carlos de Bariloche, Argentina

2. Fermi National Accelerator Laboratory, Batavia, IL, USA

3. Comisión Nacional de Energía Atómica (CNEA) and CONICET, Universidad Nacional de Córdoba, Córdoba, Argentina

Funder

Fermi Research Alliance, LLC

U.S. Department of Energy, Office of Science, Office of High Energy Physics, with support from its QuantISED Program

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture

Link

https://ieeexplore.ieee.org/ielam/8919/10137339/10102286-aam.pdf

Reference26 articles.

1. Ultra-Low Power CMOS Image Sensor With Two-Step Logical Shift Algorithm-Based Correlated Double Sampling Scheme

2. A 64 fJ/step 9-bit SAR ADC Array With Forward Error Correction and Mixed-Signal CDS for CMOS Image Sensors

3. Noise reduction techniques for CCD image sensors

4. Optimal sampling of charge-coupled devices

5. Noise Analysis and Simulation Method for a Single-Slope ADC With CDS in a CMOS Image Sensor

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