Evaluation of diffusion-driven material property profiles using three-wavelength interdigital sensor-Reference-Cited by-同舟云学术

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Evaluation of diffusion-driven material property profiles using three-wavelength interdigital sensor

Published:2001 Issue:5 Volume:8 Page:785-798
ISSN:1070-9878
Container-title:IEEE Transactions on Dielectrics and Electrical Insulation
language:
Short-container-title:IEEE Trans. Dielect. Electr. Insul.

Author:

Mamishev A.V.,Du Y.,Bau J.H.,Lesieutre B.C.,Zahn M.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/94/20740/00959702.pdf?arnumber=959702

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