Machine Learning for Structure Determination in Single-Particle Cryo-Electron Microscopy: A Systematic Review-Reference-Cited by-同舟云学术

Machine Learning for Structure Determination in Single-Particle Cryo-Electron Microscopy: A Systematic Review

Published:2022-02 Issue:2 Volume:33 Page:452-472
ISSN:2162-237X
Container-title:IEEE Transactions on Neural Networks and Learning Systems
language:
Short-container-title:IEEE Trans. Neural Netw. Learning Syst.

Author:

Wu Jia-Geng^ORCID,Yan Yang^ORCID,Zhang Dong-Xu^ORCID,Liu Bo-Wen,Zheng Qing-Bing,Xie Xiao-Liang^ORCID,Liu Shi-Qi,Ge Sheng-Xiang,Hou Zeng-Guang^ORCID,Xia Ning-Shao^ORCID

Funder

National Natural Science Foundation of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Artificial Intelligence,Computer Networks and Communications,Computer Science Applications,Software

Link

http://xplorestaging.ieee.org/ielx7/5962385/9702897/09657494.pdf?arnumber=9657494

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