Author:
Khandelwal S.,Ghosh S.,Ahsan S. A.,Chauhan Y S.
Cited by
3 articles.
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1. Process Control Solutions for GaN-on-Si Devices in a Production Line;2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC);2024-05-13
2. RF linearity trade-offs for varying T-gate geometries of GaN HEMTs on Si;International Journal of Microwave and Wireless Technologies;2023-03-20
3. Linearity Assessment of GaN HEMTs on Si using Nonlinear Characterisation;2021 16th European Microwave Integrated Circuits Conference (EuMIC);2022-04-03