Author:
Menon P.R.,Ahuja H.,Harihara M.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Combinational test generation using satisfiability;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;1996
2. Combinational ATPG theorems for identifying untestable faults in sequential circuits;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;1995
3. Identifying redundant gate replacements in verification by error modeling;Proceedings International Test Conference 2001 (Cat. No.01CH37260)
4. Using contrapositive law in an implication graph;18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design