Thermal analysis and optimization of 2.5D and 3D integrated systems with Wide I/O memory
Author:
Affiliation:
1. Fraunhofer Institute for Integrated Circuits IIS, Design Automation Division EAS, Dresden, Germany
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/6882079/6892251/06892268.pdf?arnumber=6892268
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