Influence of Imaging Parameters on AFM Surface Potential Measurements in Aqueous Solutions

Author:

Hackl Thomas1,Poik Mathias1,Schitter Georg1

Affiliation:

1. Automation and Control Institute (ACIN), TU Wien,Vienna,Austria

Funder

Austrian Science Fund FWF

Austrian Research Promotion Agency FFG

Publisher

IEEE

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Single-Harmonic Response Open-Loop Kelvin-Probe Force Microscopy;IEEE Transactions on Instrumentation and Measurement;2024

2. Quantitative Surface Potential Measurements by AC Electrostatic Force Microscopy;2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC);2023-05-22

3. Heterodyne AC Kelvin Probe Force Microscopy for Nanoscale Surface Potential Imaging in Liquids;IEEE Transactions on Instrumentation and Measurement;2023

4. Recent Advances in In Situ/Operando Surface/Interface Characterization Techniques for the Study of Artificial Photosynthesis;Inorganics;2022-12-29

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