Fast, high-resolution surface potential measurements in air with heterodyne Kelvin probe force microscopy
Author:
Publisher
IOP Publishing
Subject
Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering
Link
http://stacks.iop.org/0957-4484/27/i=24/a=245705/pdf
Reference66 articles.
1. Kelvin probe force microscopy
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5. Silicon pn junction imaging and characterizations using sensitivity enhanced Kelvin probe force microscopy
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