Towards control of Dielectric Properties in Single-Layer WS<sub>2</sub>via Defect Density Engineering-Reference-Cited by-同舟云学术

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Towards control of Dielectric Properties in Single-Layer WS₂via Defect Density Engineering

Published:2023-10-22 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE Nanotechnology Materials and Devices Conference (NMDC)
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Author:

Ağırcan Hasret¹,Convertino Domenica²,Rossi Antonio²,Martini Leonardo²,Pace Simona²,Mishra Neeraj²,Küster Kathrin³,Starke Ulrich³,Şireli Güldem Kartal¹,Forti Stiven²,Coletti Camilla²

Affiliation:

1. Istanbul Technical University,Metallurgy and Materials Engineering Department,Maslak, Istanbul,Turkey,34469

2. Center for Nanotechnology Innovation@NEST, Istituto Italiano di Tecnologia, Piazza San Silvestro 12,Pisa,Italy,I-56127

3. Max Planck Institut für Festkörperforschung, Heisenbergstr, 1,Stuttgart,Germany,D-70569

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10343386/10343419/10344144.pdf?arnumber=10344144

Reference11 articles.

1. Evolution of Electronic Structure in Atomically Thin Sheets of WS2and WSe2

2. Electronic properties of single-layer tungsten disulfide on epitaxial graphene on silicon carbide

3. Extraordinary Room-Temperature Photoluminescence in Triangular WS2 Monolayers

4. Optical Properties of 2D Semiconductor WS2

5. Local Optical Properties in CVD-Grown Monolayer WS2 Flakes

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