Extremely high performance, high density 20nm self-selecting cross-point memory for Compute Express Link
Author:
Affiliation:
1. R&D Division,SK-Hynix,Icheon,Republic of Korea
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10019319/10019320/10019415.pdf?arnumber=10019415
Reference9 articles.
1. Electro-Thermal Model for Thermal Disturbance in Cross-Point Phase-Change Memory
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1. Comprehensive Performance and Reliability Assessment of Se-based Selector-Only Memory;2024 IEEE International Reliability Physics Symposium (IRPS);2024-04-14
2. Phase-change memory via a phase-changeable self-confined nano-filament;Nature;2024-04-03
3. Bandwidth-Effective DRAM Cache for GPU s with Storage-Class Memory;2024 IEEE International Symposium on High-Performance Computer Architecture (HPCA);2024-03-02
4. Chalcogenide Ovonic Threshold Switching Selector;Nano-Micro Letters;2024-01-11
5. Enhanced Endurance Characteristics in High Performance 16nm Selector Only Memory (SOM);2023 International Electron Devices Meeting (IEDM);2023-12-09
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