Discrete event simulation modeling for semiconductor fabrication operation
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/6912063/6920764/06920863.pdf?arnumber=6920863
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Hyperparameter Tuning with Gaussian Processes for Optimal Abstraction Control in Simulation-based Optimization of Smart Semiconductor Manufacturing Systems;ACM Transactions on Modeling and Computer Simulation;2024-02-17
2. Introduction to Latest Fabrication Techniques;Handbook of Emerging Materials for Semiconductor Industry;2024
3. Hyperparameter Tunning in Simulation-based Optimization for Adaptive Digital-Twin Abstraction Control of Smart Manufacturing System;SIGSIM Conference on Principles of Advanced Discrete Simulation;2022-06-08
4. Experimental Quantification of Electrostatic Damage (ESD) in Binary Reticle with Feature of Nanometre Scale Gaps;PRZEGLĄD ELEKTROTECHNICZNY;2022-03-07
5. Weighted grey relational analysis to evaluate multilevel dispatching rules in wafer fabrication;Grey Systems: Theory and Application;2021-01-28
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