A Method of Embedded Computer Degradation Trend Prediction-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

A Method of Embedded Computer Degradation Trend Prediction

Published:2022-08-19 Issue: Volume: Page:
ISSN:
Container-title:2022 5th International Conference on Pattern Recognition and Artificial Intelligence (PRAI)
language:
Short-container-title:

Author:

Mao Yuanhong¹,Ma Zhong¹,Gao Shuda¹,Li Ling¹,Yuan Bo¹,Chai Bo¹,He Pengchao¹,Liu Xi¹

Affiliation:

1. Xi'an Microelectronics Technology Institute,Xi'an,China

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9904023/9904007/09904089.pdf?arnumber=9904089

Reference18 articles.

1. Research on evaluation method for storage life extension of components in avionics Department;yuan-yuan;Scientific and Technological Innovation and Application,2022

2. Comprehensive evaluation scheme for equipment storage life;kai;Electronic Product Reliability and Environmental Testing,2015

3. Testability Analysis for Complex Circuit Board Based on Fault Simulation and Rough Set;wang;Microelectronics & Computer,2010

4. A Novelty Method for Bayesian Reliability Assessment of Electronic Equipment;yin;Microelectronics & Computer,2014

5. A decision support model for determining the applicability of prognostic health management (PHM) approaches to electronic systems

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Long-Term Prediction Method of Computer Parameter Degradation Based on Curriculum Learning and Transfer Learning;Mathematics;2023-07-13

2. Zero-Trust for the System Design Lifecycle;Journal of Computing and Information Science in Engineering;2023-06-09

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP