1. Mao, Y., Ma, Z., Gao, S., Li, L., Yuan, B., Chai, B., He, P., and Liu, X. (2022, January 19–21). A Method of Embedded Computer Degradation Trend Prediction. Proceedings of the 2022 5th International Conference on Pattern Recognition and Artificial Intelligence (PRAI), Chengdu, China.
2. Progress in Research and Application of Failure Physical Model for Electronic Products;Liu;Equip. Environ. Eng.,2015
3. A life consumption monitoring methodology for electronic systems;Ramakrishnan;IEEE Trans. Components Packag. Technol.,2003
4. Renwick, J., Kulkarni, C.S., and Celaya, J.R. (2015, January 21–23). Analysis of Electrolytic Capacitor Degradation under Electrical Overstress for Prognostic Studies. Proceedings of the Annual Conference of the PHM Society, Beijing, China.
5. Experimental program for physics-of-failure modeling of electrolytic capacitors towards prognostics and health management;Rana;Life Cycle Reliab. Saf. Eng.,2017