500-kHz Bandwidth Feedback for Scanning Ion Conductance Microscopy With Nanoresolution-Reference-Cited by-同舟云学术

500-kHz Bandwidth Feedback for Scanning Ion Conductance Microscopy With Nanoresolution

Published:2024-02 Issue:2 Volume:71 Page:2080-2089
ISSN:0278-0046
Container-title:IEEE Transactions on Industrial Electronics
language:
Short-container-title:IEEE Trans. Ind. Electron.

Author:

Cheng Lei¹^ORCID,Zhuang Jian¹^ORCID,Wang Tianying¹,Liao Xiaobo²^ORCID,Yu Jiaxin²

Affiliation:

1. Key Laboratory of Education Ministry for Modern Design Rotor-Bearing System, Xi'an Jiaotong University, Xi'an, China

2. Key Laboratory of Testing Technology for Manufacturing Process in Ministry of Education, Southwest University of Science and Technology, Mianyang, China

Funder

National Natural Science Foundation of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Control and Systems Engineering

Link

http://xplorestaging.ieee.org/ielx7/41/10223597/10061483.pdf?arnumber=10061483

Reference29 articles.

1. A fast scanning ion conductance microscopy imaging method using compressive sensing and low-discrepancy sequences

2. A fuzzy control for high-speed and low-overshoot hopping probe ion conductance microscopy

3. Research on the Adaptive Sensitivity Scanning Method for Ion Conductance Microscopy with High Efficiency and Reliability

4. Study on a Rapid Imaging Method for Scanning Ion Conductance Microscopy Using a Double-Barreled Theta Pipette

5. Alternative configuration scheme for signal amplification with scanning ion conductance microscopy

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