A fast scanning ion conductance microscopy imaging method using compressive sensing and low-discrepancy sequences
Author:
Affiliation:
1. Key Laboratory of Education Ministry for Modern Design Rotor-Bearing System, Xi’an Jiaotong University, Xi’an 710049, China
2. School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an 710049, China
Funder
National Natural Science Foundation of China
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5048656
Reference40 articles.
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