An SEM-Based Nanomanipulation System for Multiphysical Characterization of Single InGaN/GaN Nanowires
Author:
Affiliation:
1. Department of Mechanical and Industrial Engineering, University of Toronto, Toronto, Canada
2. Department of Electrical and Computer Engineering, McGill University, Montreal, Canada
Funder
Natural Sciences and Engineering Research Council of Canada
University of Toronto
National Natural Science Foundation of China
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Control and Systems Engineering
Link
http://xplorestaging.ieee.org/ielx7/8856/10007430/09708422.pdf?arnumber=9708422
Reference50 articles.
1. Microrobot System for Automatic Nanohandling Inside a Scanning Electron Microscope
2. Smart Flexible Microrobots for Scanning Electron Microscope (SEM) Applications
3. Fabrication and Characterization of Three-Dimensional InGaAs/GaAs Nanosprings
4. Automated Robotic Manipulation of Individual Colloidal Particles Using Vision-Based Control
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