Real-Time Quantitative Electromechanical Characterization of Nanomaterials Based on Integrated MEMS Device-Reference-Cited by-同舟云学术

Real-Time Quantitative Electromechanical Characterization of Nanomaterials Based on Integrated MEMS Device

Published:2023-10-01 Issue:19 Volume:23 Page:22592-22599
ISSN:1530-437X
Container-title:IEEE Sensors Journal
language:
Short-container-title:IEEE Sensors J.

Author:

Huang Yuheng¹^ORCID,Nie Meng¹^ORCID,Li Binghui¹,Wu Bozhi¹,Zheng Anqi¹^ORCID,Yin Kuibo¹^ORCID,Sun Litao¹^ORCID

Affiliation:

1. SEU-FEI Nano-Pico Center, Key Laboratory of MEMS of Ministry of Education, School of Electronic Science and Engineering, Southeast University, Nanjing, China

Funder

National Natural Science Foundation of China

Jiangsu Provincial Natural Science Foundation of China

Key Research and Development Program of Jiangsu Province

Fundamental Research Funds for the Central Universities

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/7361/10269339/10230022.pdf?arnumber=10230022

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4. Piezoresistive effect of n-type 〈111〉-oriented Si nanowires under large tension/compression

5. Mechanical characteristics of individual TiO2 nanowire and TiO2 nanowire bundle on micro-manipulator nanoprobe system

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