Fast Test Generation for Structurally Similar Circuits
Author:
Affiliation:
1. Purdue University,School of Electrical & Computer Engg.,W. Lafayette,IN,USA
2. Siemens Digital Industries Software,Wilsonville,OR,USA
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9793839/9794139/09794232.pdf?arnumber=9794232
Reference25 articles.
1. A Case Study of Testing Strategy for AI SoC
2. Controllability/observability analysis of digital circuits
3. Testability-Driven Fault Sampling for Deterministic Test Coverage Estimation of Large Designs
4. Homogeneous many-core processor system test distribution and execution mechanism
5. Innovative Practices on DFT for AI Chips
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