Author:
Chaudhuri Arjun,Talukdar Jonti,Su Fei,Chakrabarty Krishnendu
Funder
Semiconductor Research Corporation
Cited by
11 articles.
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1. STRAIT: Self-Test and Self-Recovery for AI Accelerator;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-09
2. Automatic Test Pattern Generation and Compaction for Deep Neural Networks;Proceedings of the 28th Asia and South Pacific Design Automation Conference;2023-01-16
3. Test Optimization in Memristor Crossbars Based on Path Selection;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-01
4. Architecting Decentralization and Customizability in DNN Accelerators for Hardware Defect Adaptation;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022-11
5. Machine Learning for Testing Machine-Learning Hardware;Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design;2022-10-30