CNN-based Stochastic Regression for IDDQ Outlier Identification-Reference-Cited by-同舟云学术

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CNN-based Stochastic Regression for IDDQ Outlier Identification

Published:2020-04 Issue: Volume: Page:
ISSN:
Container-title:2020 IEEE 38th VLSI Test Symposium (VTS)
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Author:

Chen Chun-Teng,Yen Chia-Heng,Wen Cheng-Yen,Yang Cheng-Hao,Wu Kai-Chiang,Chern Mason,Chen Ying-Yen,Kuo Chun-Yi,Lee Jih-Nung,Kao Shu-Yi,Chao Mango Chia-Tso

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9106465/9107548/09107570.pdf?arnumber=9107570

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Translating Test Responses to Images for Test-termination Prediction via Multiple Machine Learning Strategies;ACM Transactions on Design Automation of Electronic Systems;2024-08-13

2. Parametric Fault Detection of Analog Circuits by Utilizing the Fundamental RMS of the Supply Current Fluctuation;2024 13th International Conference on Modern Circuits and Systems Technologies (MOCAST);2024-06-26

3. CNN-Based Stochastic Regression for IDDQ Outlier Identification;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-11

4. Improved Fault Detection of Analog Circuits by utilizing the Fundamental RMS of the Supply Current Fluctuation;2023 12th International Conference on Modern Circuits and Systems Technologies (MOCAST);2023-06-28

5. Outlier Detection for Analog Tests Using Deep Learning Techniques;2023 IEEE 41st VLSI Test Symposium (VTS);2023-04-24

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