Modeling, Detection, and Diagnosis of Faults in Multilevel Memristor Memories-Reference-Cited by-同舟云学术

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Modeling, Detection, and Diagnosis of Faults in Multilevel Memristor Memories

Published:2015-05 Issue:5 Volume:34 Page:822-834
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Kannan Sachhidh,Karimi Naghmeh,Karri Ramesh,Sinanoglu Ozgur

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx7/43/7088672/07017558.pdf?arnumber=7017558

Cited by 56 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. An overview memristor based hardware accelerators for deep neural network;Concurrency and Computation: Practice and Experience;2024-01-04

2. Adversarial Testing: A Novel On-Line Testing Method for Deep Learning Processors;2023 IEEE 32nd Asian Test Symposium (ATS);2023-10-14

3. On Tolerating Variations and Faults in Memristor Crossbar Based Neural Network Accelerators by Network Expansion and Weight Zeroing;2023 IEEE 32nd Asian Test Symposium (ATS);2023-10-14

4. Fault Injection in Native Logic-in-Memory Computation on Neuromorphic Hardware;2023 60th ACM/IEEE Design Automation Conference (DAC);2023-07-09

5. Exploiting device-level non-idealities for adversarial attacks on ReRAM-based neural networks;Memories - Materials, Devices, Circuits and Systems;2023-07

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