Efficient Yield Optimization for Analog and SRAM Circuits via Gaussian Process Regression and Adaptive Yield Estimation

Author:

Wang Mengshuo,Lv Wenlong,Yang Fan,Yan Changhao,Cai Wei,Zhou Dian,Zeng Xuan

Funder

National Major Science and Technology Special Project of China

National Key Research and Development Program of China

National Natural Science Foundation of China

Recruitment Program of Global Experts (the Thousand Talents Plan)

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

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