Author:
Pan David Z.,Yu Bei,Gao Jhih-Rong
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
78 articles.
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3. Deep Image Segmentation for Defect Detection in Photo-lithography Fabrication;2023 24th International Symposium on Quality Electronic Design (ISQED);2023-04-05
4. Adaptive Layout Decomposition With Graph Embedding Neural Networks;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022-11
5. AdaOPC;Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design;2022-10-30