Partial Discharge Degradation Mechanism of Nanocomposite Enameled Twisted Pair under Repetitive Impulse Voltage Application-Reference-Cited by-同舟云学术

Partial Discharge Degradation Mechanism of Nanocomposite Enameled Twisted Pair under Repetitive Impulse Voltage Application

Published:2021-12-12 Issue: Volume: Page:
ISSN:
Container-title:2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
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Author:

Takenouchi Sho¹,Zenda Yuki¹,Kozako Masahiro¹,Hikita Masayuki¹,Fujimoto Nobutaka²,Hayashizaka Noriyuki²,Kato Toshihiko²,Kikuchi Hideyuki³

Affiliation:

1. Kyushu Institute of Technology,Fukuoka,Japan,804-8550

2. Sumitomo Seika Chemicals Co., Ltd,Hyogo,Japan,675-0145

3. Hide Technology LLC,Ibaraki,Japan,319-1308

Funder

New Energy and Industrial Technology Development Organization

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9705287/9705312/09705325.pdf?arnumber=9705325

Reference6 articles.

1. Dielectric and Insulation Properties of Polyimide-based Boehmite Nanocomposite Material

2. Innovative Functional Insulating Materials Development for Advanced Electric Power Apparatuses - Outline of NEDO Project -;hikita;Conference Proceedings of ISEIM 2020,2020

3. Simultaneous Measurement of Charge and Light Emission by Partial Discharges till Breakdown of Polyimide/Boehmite Nanocomposite Enamel Wire under Bipolar Repetitive Impulse Voltage Application;matsuzoe;IEE Japan,2019

4. Partial Discharge Properties till Breakdown of Boehmite Added Enameled Twisted Pair Partial Discharge Properties till Breakdown of Boehmite Added Enameled Twisted Pair under Bipolar Repetitive Impulse Voltage Application under Bipolar Repetitive Impulse Voltage Application;takenouchi;Electrical Insulation Conference,2020

5. Durability Test of Enamel Containing Nano-Cray under Artificial inverter Surge Condition for Medium and Small-Scale Generator;fujimoto;Conference Proceedings of ISEIM 2020,2020

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Prediction of Lifetime in Surge Resistant Enamel Twisted Pair by Partial Discharge Degradation under Repetitive Impulse Voltage Application;2022 IEEE 4th International Conference on Dielectrics (ICD);2022-07-03