Prediction of Lifetime in Surge Resistant Enamel Twisted Pair by Partial Discharge Degradation under Repetitive Impulse Voltage Application-Reference-Cited by-同舟云学术

Prediction of Lifetime in Surge Resistant Enamel Twisted Pair by Partial Discharge Degradation under Repetitive Impulse Voltage Application

Published:2022-07-03 Issue: Volume: Page:
ISSN:
Container-title:2022 IEEE 4th International Conference on Dielectrics (ICD)
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Author:

Kozako Masahiro¹,Zenda Yuki¹,Kodama Shota¹,Hikita Masayuki¹,Hayashizaka Noriyuki²,Fujimoto Nobutaka²,Kikuchi Hideyuki³

Affiliation:

1. Kyushu Institute of Technology,Department of Electrical and Electronics Engineering,Fukuoka,Japan

2. Sumitomo Seika Chemicals Co., Ltd,Hyogo,Japan

3. Hide Technology LLC.,Ibaraki,Japan

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9863422/9863219/09863577.pdf?arnumber=9863577

Reference5 articles.

1. Life Estimation of Enamel Twisted Pair Suffering Partial Discharge under Repetitive Impulse Voltage

2. Dielectric and Insulation Properties of Polyimide-based Boehmite Nanocomposite Material

3. The Effect of Insulation Thickness on V-t (Voltage-Lifetime) Characteristics of Insulating Materials Exposed to Partial Discharges;hirabayashi;IEE Japan,1979

4. Partial Discharge Degradation Mechanism of Nanocomposite Enameled Twisted Pair under Repetitive Impulse Voltage Application

5. Partial Discharge Properties till Breakdown of Boehmite Added Enameled Twisted Pair under Bipolar Repetitive Impulse Voltage Application

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