Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
14 articles.
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1. Prediction of JTE breakdown performance in SiC PiN diode radiation detectors using TCAD augmented machine learning;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2024-04
2. A Multi-Step Sraf to Improve Process Windows in Metal Layer;2023 China Semiconductor Technology International Conference (CSTIC);2023-06-26
3. Generation of inverse assist features using generative adversarial networks;Microelectronic Engineering;2023-03
4. Curvilinear mask optimization with refined generative adversarial nets;Journal of Micro/Nanopatterning, Materials, and Metrology;2023-01-19
5. Data-Driven Approaches for Process Simulation and Optical Proximity Correction;Proceedings of the 28th Asia and South Pacific Design Automation Conference;2023-01-16