Design of Digital Circuits Using Inverse-Mode Cascode SiGe HBTs for Single Event Upset Mitigation-Reference-Cited by-同舟云学术

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Design of Digital Circuits Using Inverse-Mode Cascode SiGe HBTs for Single Event Upset Mitigation

Published:2010-12 Issue: Volume: Page:
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Thrivikraman Tush,Wilcox Edward,Phillips Stanley D.,Cressler John D.,Marshall Cheryl,Vizkelethy Gyorgy,Dodd Paul,Marshall Paul

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx5/23/5657993/05658004.pdf?arnumber=5658004

Cited by 20 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Investigation of f T-Doubler Technique to Improve RF Performance of Inverse-Mode SiGe HBTs;IEEE Microwave and Wireless Components Letters;2020-09

2. Mitigation of Single-Event Effects in SiGe-HBT Current-Mode Logic Circuits;Sensors;2020-05-01

3. Cryogenic Characterization of RF Low-Noise Amplifiers Utilizing Inverse-Mode SiGe HBTs for Extreme Environment Applications;IEEE Transactions on Device and Materials Reliability;2018-12

4. SiGe HBT Profiles With Enhanced Inverse-Mode Operation and Their Impact on Single-Event Transients;IEEE Transactions on Nuclear Science;2018-01

5. Introduction;Research on the Radiation Effects and Compact Model of SiGe HBT;2017-10-24

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