Fabrication of a 650V Superjunction MOSFET With Built-in MOS-Channel Diode for Fast Reverse Recovery
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx7/55/8746723/08706995.pdf?arnumber=8706995
Cited by 24 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Superjunction MOSFET with an N-Dot Region in the P-Pillar for Soft Reverse Recovery;2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD);2024-06-02
2. Experimental Demonstration of a 650-V Superjunction MOSFET With Dual Schottky Contacts for Fast Reverse Recovery;IEEE Transactions on Electron Devices;2024-06
3. A 4H-SiC Superjunction MOSFET Design for High Gate Oxide Reliability;2024 4th International Conference on Electronics, Circuits and Information Engineering (ECIE);2024-05-24
4. Machine Learning-Based Figure of Merit Model of SIPOS Modulated Drift Region for U-MOSFET;Micromachines;2024-03-19
5. A novel split-gate trench MOSFET embedded with a high-k pillar for higher breakdown voltage;Semiconductor Science and Technology;2024-02-08
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