A Stripline Width-Array Method for Determining a Causal Model for the Complex Permittivity-Reference-Cited by-同舟云学术

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A Stripline Width-Array Method for Determining a Causal Model for the Complex Permittivity

Published:2021-03 Issue:3 Volume:31 Page:328-331
ISSN:1531-1309
Container-title:IEEE Microwave and Wireless Components Letters
language:
Short-container-title:IEEE Microw. Wireless Compon. Lett.

Author:

Chaparro-Ortiz Dora Alejandra,Torres-Torres Reydezel

Funder

Consejo Nacional de Ciencia y Tecnología (CONACyT), Mexico

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics

Link

http://xplorestaging.ieee.org/ielx7/7260/9374848/09317731.pdf?arnumber=9317731

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. An Overview of RF and Microwave Research in Latin America: Scanning Latin American Research on Microwaves;IEEE Microwave Magazine;2023-05

2. Relative Permittivity and Loss Tangent Determination Combining Broadband S-parameter and Single-Frequency Resonator Measurements;IEEE Transactions on Electromagnetic Compatibility;2022-08

3. Preparation of polysiloxane foam with graphene for promoting electromagnetic interference shielding performance and thermal stability;Journal of Applied Polymer Science;2022-03-24

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