Relative Permittivity and Loss Tangent Determination Combining Broadband S-parameter and Single-Frequency Resonator Measurements
Author:
Affiliation:
1. Óptica y Electrónica, Instituto Nacional de Astrofísica, Puebla, Mexico
2. Nidec SV TCL, Tempe, AZ, USA
Funder
Consejo Nacional de Ciencia y Tecnología, Mexico
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics
Link
http://xplorestaging.ieee.org/ielx7/15/9857964/09774317.pdf?arnumber=9774317
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1. Effect of conductor profile on the insertion loss, phase constant, and dispersion in thin high frequency transmission lines;horn;Proc DesignCon,0
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5. An Efficient Approach to Find the Truncation Frequency for Transmission Line-Based Dielectric Material Property Extraction
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