Improving Deep Metric Learning by Divide and Conquer-Reference-Cited by-同舟云学术

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Improving Deep Metric Learning by Divide and Conquer

Published:2021 Issue: Volume: Page:1-1
ISSN:0162-8828
Container-title:IEEE Transactions on Pattern Analysis and Machine Intelligence
language:
Short-container-title:IEEE Trans. Pattern Anal. Mach. Intell.

Author:

Sanakoyeu Artsiom,Ma Pingchuan,Tschernezki Vadim,Ommer Bjorn

Funder

German Research Foundation DFG

German federal ministry BMWi within the project KI Absicherung

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Applied Mathematics,Artificial Intelligence,Computational Theory and Mathematics,Computer Vision and Pattern Recognition,Software

Link

http://xplorestaging.ieee.org/ielx7/34/4359286/09540303.pdf?arnumber=9540303

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Discriminative Feature Enhancement Network for few-shot classification and beyond;Expert Systems with Applications;2024-12

2. Relationship constraint deep metric learning;Applied Intelligence;2024-04

3. Consistent penalizing field loss for zero-shot image retrieval;Expert Systems with Applications;2024-02

4. Visual Embedding Augmentation in Fourier Domain for Deep Metric Learning;IEEE Transactions on Circuits and Systems for Video Technology;2023-10

5. Cross-Image-Attention for Conditional Embeddings in Deep Metric Learning;2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR);2023-06

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