Cross-Image-Attention for Conditional Embeddings in Deep Metric Learning-Reference-Cited by-同舟云学术

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Cross-Image-Attention for Conditional Embeddings in Deep Metric Learning

Published:2023-06 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)
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Author:

Kotovenko Dmytro¹,Ma Pingchuan¹,Milbich Timo¹,Ommer Björn¹

Affiliation:

1. LMU Munich, IWR Heidelberg, MCML

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10203037/10203050/10203103.pdf?arnumber=10203103

Reference91 articles.

1. Deep Adversarial Metric Learning

2. Softtriple loss: Deep metric learning without triplet sam-pling;qian;Proceedings of the IEEE/CVF International Con-ference on Computer Vision (ICCV),0

3. An image is worth 16x16 words: Transformers for image recognition at scale;dosovitskiy;ICLRE,2021

4. Deep metric learning with bier: Boosting inde-pendent embeddings robustly;opitz;IEEE Transactions on Pattern Analysis and Machine Intelligence,2018

5. Training vision transformers for image re-trieval;el-nouby;CoRR,2021

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2. Learning shared template representation with augmented feature for multi-object pose estimation;Neural Networks;2024-08

3. Learning Dynamic Batch-Graph Representation for Deep Representation Learning;International Journal of Computer Vision;2024-07-19

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