Author:
Ooi Y.,Kashimura M.,Takeuchi H.,Kawamura E.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Cited by
11 articles.
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1. DEFCAM;ACM Transactions on Architecture and Code Optimization;2011-10
2. Inquisitive Defect Cache: A Means of Combating Manufacturing Induced Process Variation;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2011-09
3. Dependability Aspects Regarding the Cache Level of a Memory Hierarchy using Hamming Codes;Innovations in Computing Sciences and Software Engineering;2010
4. Aspects Regarding the Implementation of Hsiao Code to the Cache Level of a Memory Hierarchy with Fpga Xilinx Circuits;Advanced Techniques in Computing Sciences and Software Engineering;2009-12-15
5. Fault Tolerant Cache Schemes;Lecture Notes in Electrical Engineering;2009