Meander delay line challenge problem: a comparison using FDTD, FEM and MoM-Reference-Cited by-同舟云学术

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Meander delay line challenge problem: a comparison using FDTD, FEM and MoM

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Container-title:2001 IEEE EMC International Symposium. Symposium Record. International Symposium on Electromagnetic Compatibility (Cat. No.01CH37161)
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Author:

Bhobe A.U.,Holloway C.L.,Piket-May M.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/7550/20565/00950479.pdf?arnumber=950479

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Analytical Models for Calculating the Time Response in a Turn of a Meander Line of Two Segments;2022 IEEE 23rd International Conference of Young Professionals in Electron Devices and Materials (EDM);2022-06-30

3. Meander-DGS Effect on Electromagnetic Bandgap Structure for Power/Ground Noise Suppression in High-Speed Integrated Circuit Packages and PCBs;Electronics;2022-01-10

4. Analytical Conditions for Equalizing and Reducing the Amplitudes of the Time Response Components in the Meander Line Turn;Journal of Communications Technology and Electronics;2022-01

5. Using a Turn of a Meander Microstrip Line for ESD Protection;Electrica;2021-12-29

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