NBTI Degradation in LTPS TFTs Under Mechanical Tensile Strain-Reference-Cited by-同舟云学术

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NBTI Degradation in LTPS TFTs Under Mechanical Tensile Strain

Published:2011-07 Issue:7 Volume:32 Page:907-909
ISSN:0741-3106
Container-title:IEEE Electron Device Letters
language:
Short-container-title:IEEE Electron Device Lett.

Author:

Lin Chia-Sheng,Chen Ying-Chung,Chang Ting-Chang,Jian Fu-Yen,Hsu Wei-Che,Kuo Yuan-Jui,Dai Chih-Hao,Chen Te-Chih,Lo Wen-Hung,Hsieh Tien-Yu,Shih Jou-Miao

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/55/5931087/05782929.pdf?arnumber=5782929

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