Demonstration of Split-Gate Type Trigate Flash Memory With Highly Suppressed Over-Erase-Reference-Cited by-同舟云学术

Demonstration of Split-Gate Type Trigate Flash Memory With Highly Suppressed Over-Erase

Published:2012-03 Issue:3 Volume:33 Page:345-347
ISSN:0741-3106
Container-title:IEEE Electron Device Letters
language:
Short-container-title:IEEE Electron Device Lett.

Author:

Kamei Takahiro,Liu Yongxun,Matsukawa Takashi,Endo Kazuhiko,O'uchi Shinichi,Tsukada Junichi,Yamauchi Hiromi,Ishikawa Yuki,Hayashida Tetsuro,Sakamoto Kunihiro,Ogura Atsushi,Masahara Meishoku

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/55/6155120/06145732.pdf?arnumber=6145732

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